- Low error voltage
- High-Speed analog circuit performance
- Negligible Off-error, excellent accuracy
- Good frequency response, with low glitches
- Eliminates additional buffering
Applications:
- Analog Switches
- Sample & Hold
- Choppers
Test conditions:
- BVGSS -40V @ IG = -1µA, VDS = 0V
- IGSS(MAX) -0.1nA @ VGS= -20V, V
= 0V - ID(OFF) MAX 0.1nA @ VDS= 20V, VGS= -12V
- VP(MIN) -0.5V @ VDS= 20V, ID= 1nA
- VP(MAX) -3V @ VDS= 20V, ID= 1nA
- IDSS(MIN) 5mA @ VDS= 20V, VGS = 0V
- IDSS(MAX) 30mA @ VDS= 20V, VGS = 0V
- rDS(ON)MAX 100Ω @ ID= 1mA, VGS = 0V
- CISS(MAX) 14pF @ VGS= 0V, VDS= 20V, f= 1MHz
- CRSS(MAX) 3.5pF @ VDS= 0V, VGS= -12V, f= 1MHz
- ton(TYP) 2ns @ VDD = 10V, VGS(H) = 0V
Linear Systems
Electrical Datasheet
Die Physical Data:
Footprint: 0.341mm² (529mil²)
Request Pad Layout
- N/A
IGSS: -0.1nA
VGS(OFF) MIN: -0.5V
VGS(OFF) MAX: -3V
IDSS(MIN): 5mA
IDSS(MAX): 75mA
IDSS @ VDS: 20V
RDS(ON)MAX: 100Ω
CRSS(MAX): 3.5pF
- Green:Available from stock or at low factory MOQ.
- Amber: Available on factory order with MOQ.
- Red: High factory MOQ may apply, please ask for details.
- Green: This bare die is specified and tested for use in high reliability applications.
- Amber: This bare die can meet higher reliability specifications with additional testing & qualification, please ask for details.
- Red: This bare die is not specified or specifically designed for use in high reliability applications.
- Green: This bare die is qualified for space applications or has space level qualification data, please ask for details.
- Amber: This bare die can be specified for space applications with additional testing and qualification, please ask for details.
- Red: Suitability of this bare die for space applications is unknown and requires further qualification, please ask for details.