- Features: Analog Output, Low-side Capable
Texas Instruments
Electrical Datasheet
Die Physical Data:
Footprint: 1.065mm² (1650mil²)
Request Pad Layout
- N/A
VS (Max): 18V
CMRR (Min): 100dB
VCM (Max): 80V
VCM (Min): -16V
Gain Error : 0.2%
Gain: 20V/V
VIO (Max): 2,000µV
VIO (Max) Drift: 2.5µV/°C
BW Small Signal: 0.50MHz
IQ (Max): 0.90mA
- N/A
VS (Max): 18.00V
CMRR (Min): 100dB
VCM (Max): 80.0V
VCM (Min): -16.0V
Gain Error : 0.2%
Gain: 20V/V
VIO (Max): 2,000µV
VOS Drift: 2.50µV/°C
BW Small Signal: 0.50MHz
IQ (Max): 0.90mA
- Green:Available from stock or at low factory MOQ.
- Amber: Available on factory order with MOQ.
- Red: High factory MOQ may apply, please ask for details.
- Green: This bare die is specified and tested for use in high reliability applications.
- Amber: This bare die can meet higher reliability specifications with additional testing & qualification, please ask for details.
- Red: This bare die is not specified or specifically designed for use in high reliability applications.
- Green: This bare die is qualified for space applications or has space level qualification data, please ask for details.
- Amber: This bare die can be specified for space applications with additional testing and qualification, please ask for details.
- Red: Suitability of this bare die for space applications is unknown and requires further qualification, please ask for details.