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Product Family: Boundary Scan (JTAG) Logic

Find and add the required Boundary Scan (JTAG) Logic IC to your project by using our part finder tool and bill of material creator.

Please use our Parametric Search Tool or alternatively select a product from the list below:

Available Products:

SN74ABT18245A Scan Test Devices With 18-Bit Bus Transceivers
SN74ABT18502 Scan Test Devices With 18-Bit Universal Bus Transceiver
SN74ABT18504 Scan Test Devices With 20-Bit Universal Bus Transceivers
SN74ABT18640 Scan Test Devices With 18-Bit Inverting Bus Transceivers
SN74ABT18646 Scan Test Devices With 18-Bit Bus Transceivers And Registers
SN74ABT18652 Scan Test Devices With 18-Bit Bus Transceivers And Registers
SN74ABT8245 Scan Test Devices With Octal Bus Transceivers
SN74ABT8543 Scan Test Devices With Octal Registered Bus Transceivers
SN74ABT8646 Scan Test Devices With Octal Bus Transceivers And Registers
SN74ABT8652 Scan Test Devices With Octal Bus Transceivers And Registers
SN74ABT8952 Scan Test Devices With Octal Registered Bus Transceivers
SN74ABTH182502A Scan Test Devices With 18-Bit Universal Bus Transceivers
SN74ABTH182504A Scan Test Devices With 20-Bit Universal Bus Transceivers
SN74ABTH182646A Scan Test Devices With 18-Bit Transceivers And Registers
SN74ABTH182652A Scan Test Devices With 18-Bit Transceivers And Registers
SN74ABTH18502A Scan Test Devices With 18-Bit Universal Bus Transceivers
SN74ABTH18504A Scan Test Devices With 20-Bit Universal Bus Transceivers
SN74ABTH18646A Scan Test Devices With 18-Bit Transceivers And Registers
SN74ABTH18652A Scan Test Devices With 18-Bit Transceivers And Registers
SN74ACT8990 Test-Bus Controllers IEEE Std 1149.1 (JTAG) TAP Masters With 16-Bit Generic Host Interfaces
SN74BCT8240A IEEE Std 1149.1 (JTAG) Boundary-Scan Test Device With Octal Inverting Buffers
SN74BCT8244A IEEE Std 1149.1 (JTAG) Boundary-Scan Test Device With Octal Buffers
SN74BCT8245A IEEE Std 1149.1 (JTAG) Boundary-Scan Test Device With Octal Bus Transceivers
SN74BCT8373A IEEE Std 1149.1 (JTAG) Boundary-Scan Test Device With Octal D-Type Latches
SN74BCT8374A Scan Test Device With Octal D-Type Edge-Triggered Flip-Flops
SN74LVT18512 3.3-V ABT Scan Test Devices With 18-Bit Universal Bus Transceivers
SN74LVTH182502A 3.3-V ABT Scan Test Devices With 18-Bit Universal Bus Transceivers
SN74LVTH182504A 3.3-V ABT Scan Test Devices With 20-Bit Universal Bus Transceivers
SN74LVTH182512 3.3-V ABT Scan Test Devices With 18-Bit Universal Bus Transceivers
SN74LVTH182646A 3.3-V ABT Scan Test Devices With 18-Bit Transceivers And Registers
SN74LVTH182652A 3.3-V ABT Scan Test Devices With 18-Bit Transceivers And Registers
SN74LVTH18502A 3.3-V ABT Scan Test Devices With 18-Bit Universal Bus Transceivers
SN74LVTH18504A 3.3-V ABT Scan Test Devices With 20-Bit Universal Bus Transceivers
SN74LVTH18512 3.3-V ABT Scan Test Devices With 18-Bit Universal Bus Transceivers
SN74LVTH18514 3.3-V ABT Scan Test Devices With 20-Bit Universal Bus Transceivers
SN74LVTH18646A 3.3-V ABT Scan Test Devices With 18-Bit Transceivers And Registers
SN74LVTH18652A 3.3-V ABT Scan Test Devices With 18-Bit Transceivers And Registers