- Low error voltage
- High-Speed Analog Circuit Performance
- Negligible Off-Error, Excellent Accuracy
- Good Frequency Response
- Eliminates Additional Buffering
Applications:
- Analog Switches
- Choppers
- Sample-And-Hold
- Normally On Switches
- Current Limiters
Test conditions:
- BVGSS 30V @ IG = 1µA, VDS =0V
- IGSS(MAX) 1nA @ VGS= 20V, VDS = 0V
- ID(OFF) MAX -1nA @ VDS= -15V, VGS= 10V
- VP(MIN) 1V @ VDS= -15V, ID= -10nA
- VP(MAX) 4V @ VDS= -15V, ID= -10nA
- IDSS(MIN) -2mA @ VDS= -15V, VGS = 0V
- IDSS(MAX) -55mA @ VDS= -15V, VGS = 0V
- rDS(ON) 250Ω @ , VGS = 0V, VDS = 0.1V
- CISS(MAX) 11pF @ VGS= 0V, VDS= -10V
- CRSS(MAX) 7pF @ VDS= 0V, VGS= 10V
- toff(TYP) 10ns @ VGS(L) = 0V, VGS(H) = 10V
Linear Systems
Electrical Datasheet
Die Physical Data:
Footprint: 0.341mm² (529mil²)
Request Pad Layout
- N/A
IGSS: 1.0nA
VGS(OFF) MIN: 1.0V
VGS(OFF) MAX: 4.0V
IDSS(MIN): -2.0mA
IDSS(MAX): -25mA
IDSS @ VDS: -15V
RDS(ON)MAX: 250Ω
CRSS(MAX): 7pF
- Green:Available from stock or at low factory MOQ.
- Amber: Available on factory order with MOQ.
- Red: High factory MOQ may apply, please ask for details.
- Green: This bare die is specified and tested for use in high reliability applications.
- Amber: This bare die can meet higher reliability specifications with additional testing & qualification, please ask for details.
- Red: This bare die is not specified or specifically designed for use in high reliability applications.
- Green: This bare die is qualified for space applications or has space level qualification data, please ask for details.
- Amber: This bare die can be specified for space applications with additional testing and qualification, please ask for details.
- Red: Suitability of this bare die for space applications is unknown and requires further qualification, please ask for details.