- Short Sample-&-Hold Aperture Time
- Low insertion loss
- Low noise
Applications:
- Analog Switches
- Commutators
- Choppers
Test conditions:
- BVGSS -35V @ IG = -1µA, VDS = 0V
- IGSS(MAX) -1nA @ VGS= -15V, VDS = 0V
- ID(OFF) MAX 1nA @ VDS= 5V, VGS= -10V
- VP(MIN) -3V @ VDS= 5V, ID= 1µA
- VP(MAX) -10V @ VDS= 5V, ID= 1µA
- IDSS(MIN) 20mA @ VDS= 15V, VGS = 0V
- IDSS(MAX) -mA @ VDS= 15V, VGS = 0V
- rDS(ON)MAX 30Ω @ VGS = 0V, VDS = 0.1V
- CISS(MAX) 12pF @ VGS= -10V, VDS= 0V, f = 1 MHz
- CRSS(MAX) 5pF @ VDS= 0V, VGS= -10V, f = 1 MHz
- ton(TYP) 2ns @ VDD = 10V, VGS(H) = 0V
Linear Systems
Electrical Datasheet
Die Physical Data:
Footprint: 0.341mm² (529mil²)
Request Pad Layout
- N/A
IGSS: -1.0nA
VGS(OFF) MIN: -3.0V
VGS(OFF) MAX: -10V
IDSS(MIN): 20mA
IDSS(MAX): n/a
IDSS @ VDS: 15V
RDS(ON)MAX: 30Ω
CRSS(MAX): 5.0pF
- Green:Available from stock or at low factory MOQ.
- Amber: Available on factory order with MOQ.
- Red: High factory MOQ may apply, please ask for details.
- Green: This bare die is specified and tested for use in high reliability applications.
- Amber: This bare die can meet higher reliability specifications with additional testing & qualification, please ask for details.
- Red: This bare die is not specified or specifically designed for use in high reliability applications.
- Green: This bare die is qualified for space applications or has space level qualification data, please ask for details.
- Amber: This bare die can be specified for space applications with additional testing and qualification, please ask for details.
- Red: Suitability of this bare die for space applications is unknown and requires further qualification, please ask for details.