- Ultra-low noise en 1.8nV/√Hz(TYP)
- Low input capacitance CISS 4pF(TYP)
- Low gate leakeage, IGSS & IG
Applications:
- Wideband differential amplifiers
- High-speed temperature compensated single-ended input amplifiers
- High speed comparators
- Impedance converters
Test conditions:
- BVGSS -60V @ ID = 1nA, VDS = 0V
- IGSS(MAX) -100pA @ VGS= -15V
- VP(MIN) -1.5V @ VDS= 15V, ID= 1nA
- VP(MAX) -3.5V @ VDS= 15V, ID= 1nA
- IDSS(MIN) 2.5mA @ VDS= 15V, VGS = 0V
- IDSS(MAX) 15mA @ VDS= 15V, VGS= 0V
- CISS(MAX) 8pF @ VDS= 15V, ID = 500µA, f = 1MHz
- CRSS(MAX) 3pF @ VDS= 15V, ID = 500µA, f = 1MHz
Linear Systems
Electrical Datasheet
Die Physical Data:
Footprint: 0.383mm² (594mil²)
Request Pad Layout
- N/A
IGSS: -100pA
VGS(OFF) MIN: -1.5V
VGS(OFF) MAX: -3.5V
IDSS(MIN): 2.5mA
IDSS(MAX): 15.0mA
IDSS @ VDS: 15V
en: 1.8nV√Hz
gfs(MIN): 1.5mS
CISS(MAX): 8pF
CRSS(MAX): 3pF
- Green:Available from stock or at low factory MOQ.
- Amber: Available on factory order with MOQ.
- Red: High factory MOQ may apply, please ask for details.
- Green: This bare die is specified and tested for use in high reliability applications.
- Amber: This bare die can meet higher reliability specifications with additional testing & qualification, please ask for details.
- Red: This bare die is not specified or specifically designed for use in high reliability applications.
- Green: This bare die is qualified for space applications or has space level qualification data, please ask for details.
- Amber: This bare die can be specified for space applications with additional testing and qualification, please ask for details.
- Red: Suitability of this bare die for space applications is unknown and requires further qualification, please ask for details.