- Ultra-low noise en 0.9nV/√Hz (TYP)
- High gain Gfs 22mS (TYP)
- High input impedance IG 1nA
- Low capacitance CRSS 32pF (TYP)
Applications:
- Low noise audio amplifiers
- Input stages of EQ and M.C. head amplifier
Test conditions:
- BVGDS 25V @ IG = 100µA, VDS = 0V
- IGSS(MAX) 1nA @ VGS= 25V, VDS = 0V
- VP(MIN) 0.15V @ VDS= -10V, ID= -100nA
- VP(MAX) 2V @ VDS= -10V, ID= -100nA
- IDSS(MIN) -17mA @ VDG= -10V, VGS = 0V
- IDSS(MAX) -30mA @ VDG= -10V, VGS = 0V
- gfs(TYP) 22mS @ VDS= -10V, VGS = 0V, f= 1 kHz
- en 1.9nV/Hz @ VDS = -10V, ID = -2mA, f = 1 kHz, NBW = 1 Hz
- CISS(MAX) 105pF @ VGS= 0V, VDS= -10V, f = 1 MHz
- CRSS(MAX) 32pF @ VDS= -10V, ID = 0A, f = 1 MHz
Linear Systems
Electrical Datasheet
Die Physical Data:
Footprint: 1.137mm² (1763mil²)
Request Pad Layout
- N/A
IGSS: 1nA
VGS(OFF) MIN: 0.15V
VGS(OFF) MAX: 2.0V
IDSS(MIN): -17.0mA
IDSS(MAX): -30.0mA
IDSS @ VDS: -10V
en: 1.9nV√Hz
gfs(MIN): 22mS
CISS(MAX): 105pF
CRSS(MAX): 32pF
- Green:Available from stock or at low factory MOQ.
- Amber: Available on factory order with MOQ.
- Red: High factory MOQ may apply, please ask for details.
- Green: This bare die is specified and tested for use in high reliability applications.
- Amber: This bare die can meet higher reliability specifications with additional testing & qualification, please ask for details.
- Red: This bare die is not specified or specifically designed for use in high reliability applications.
- Green: This bare die is qualified for space applications or has space level qualification data, please ask for details.
- Amber: This bare die can be specified for space applications with additional testing and qualification, please ask for details.
- Red: Suitability of this bare die for space applications is unknown and requires further qualification, please ask for details.