Bare Die Product Detail: UCC2915

eFuses (Integrated FET):
0 to 3A, 7 to 15V Single Hot-Swap IC Hi-Side MOSFET, 100uA IQ in Sleep Mode, Industrial Temp.

Features:

Current Limit Function Enabled: Always
On Off control input: SHTDWN\
Current Limit Accuracy: (IFAULT+ 1A)+/- 650mA, 4.1A+/- 1.1A
Imax (A): 4A
Features: Digitally Programmable, IFAULT

Vendor:
Texas Instruments
Electrical Datasheet

Die Physical Data:
Footprint: 7.818mm² (12118mil²)
Request Pad Layout

Product Families: Used for this device are tabulated below.

eFuses (Integrated FET)

Functional:

Controlled Channels: 1
I_{LIM (Type)}: Adjustable
Fault Response: Auto Retry
FET Protection: Thermal
UL Recognition: -

Specification:

R_ON: 150mΩ
V_{IN (MIN)}: 7V
V_{IN (MAX)}: 15V
V_{abs (Max)}: 15.5V
I_{LIM (Max)}: 4.0A
I_{LIM (Min)}: 1A
Overcurrent Response: Overvoltage Response: t_r: n/a

Other Detail: Important information for this device is tabulated below.

Traffic light setting for Minimum Order Quantity indicates the following:

Green:Available from stock or at low factory MOQ.
Amber: Available on factory order with MOQ.
Red: High factory MOQ may apply, please ask for details.

Traffic light setting for High Reliability indicates the following:

Green: This bare die is specified and tested for use in high reliability applications.
Amber: This bare die can meet higher reliability specifications with additional testing & qualification, please ask for details.
Red: This bare die is not specified or specifically designed for use in high reliability applications.

Traffic light setting for Space Grade indicates the following:

Green: This bare die is qualified for space applications or has space level qualification data, please ask for details.
Amber: This bare die can be specified for space applications with additional testing and qualification, please ask for details.
Red: Suitability of this bare die for space applications is unknown and requires further qualification, please ask for details.