- Features: Computed Tomography (CT)
Texas Instruments
Electrical Datasheet
Die Physical Data:
Footprint: 16.867mm² (26144mil²)
Request Pad Layout
- Bits: 20
- Channels: 2
- Interface: SPI
- Architecture: Delta-Sigma
AVDD (Min): 4.75V
AVDD (Max): 5.25V
SR(Max): 3,000SPS
Input Range: 50-1000 pCpC
- Green:Available from stock or at low factory MOQ.
- Amber: Available on factory order with MOQ.
- Red: High factory MOQ may apply, please ask for details.
- Green: This bare die is specified and tested for use in high reliability applications.
- Amber: This bare die can meet higher reliability specifications with additional testing & qualification, please ask for details.
- Red: This bare die is not specified or specifically designed for use in high reliability applications.
- Green: This bare die is qualified for space applications or has space level qualification data, please ask for details.
- Amber: This bare die can be specified for space applications with additional testing and qualification, please ask for details.
- Red: Suitability of this bare die for space applications is unknown and requires further qualification, please ask for details.